Device having spad photodiodes for detecting an object

A device, comprising:

• an emission circuit for emitting pulses of an incident photon beam, the incident photon beam being configured to generate a reflection on an object;
• a detection circuit including a first plurality of single photon avalanche photodiodes, each photodiode having a breakdown voltage of a PN junction, the detection circuit configured to detect the object, the detection circuit being configured to detect ones of the photodiodes avalanche triggering in response to at least one photon of a reflected photon beam from the reflection of the incident beam on the object;
• a voltage generation circuit configured to generate a bias voltage greater than the breakdown voltage of the PN junction of each photodiode;
• and
• a control circuit configured to select a number of the plurality of photodiodes to be reversed biased based on a load on the voltage generation circuit and to detect the object as a function of the ones of the photodiodes avalanche triggering.

A detection device, comprising:

• a substrate;
• a light emission unit on the substrate, the light emission unit configured to generate an incident photon beam;
• a reception unit on the substrate, the reception unit including a plurality of single photon avalanche photodiodes, each photodiode having a PN junction having a breakdown voltage;
• a voltage generator on the substrate, the voltage generator configured to generate a reverse bias voltage being greater than the breakdown voltage of the PN junction of each photodiode;
• a pulse generator on the substrate;
• and
• a control unit on the substrate and coupled to the light emission unit, the reception unit, the voltage generator, and the pulse generator, the control unit configured to select a number of the plurality of photodiodes to be reverse biased by the bias voltage based on a load on the voltage generation circuit and configured to determine a number of the photodiodes that avalanche trigger mode in response to at least one photon reflected from the incident beam on an object to detect the object near the detection device.