Substrate cleaning method, substrate cleaning system and program storage medium
AssigneeTokyo Electron Limited
InventorsTsukasa WATANABE, Naoki SHINDO, Takahiro FURUKAWA, Yuji KAMIKAWA
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AssigneeTokyo Electron Limited
InventorsTsukasa WATANABE, Naoki SHINDO, Takahiro FURUKAWA, Yuji KAMIKAWA
Estimating the term…
The present invention provides a substrate cleaning method capable of removing particles from the entire surface of a substrate to be processed at a high removing efficiency. In the substrate cleaning method according to the present invention, a substrate to be processed W is immersed in a cleaning liquid in a cleaning tank 12. Then, ultrasonic waves are generated in the cleaning liquid contained in the cleaning tank 12, so that the substrate to be processed W is subjected to an ultrasonic cleaning process. While the substrate to be processed is being cleaned, a dissolved gas concentration of a gas dissolved in the cleaning liquid contained in the cleaning tank is changed.
A substrate cleaning method comprising the step of:
13-22. (canceled)
A storage medium storing a program executed by a control device for controlling a substrate processing system so as to accomplish a substrate processing method comprising the steps of:
Dependencies are inferred from the claim text.