Instrumentation circuit for shunt-based metrology measurement
AssigneeItron, Inc.
InventorsHartman Van Wyk, Youcef Haddab, Jean-Jacques Dormard
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AssigneeItron, Inc.
InventorsHartman Van Wyk, Youcef Haddab, Jean-Jacques Dormard
Estimating the term…
The present subject matter is directed to methods and apparatus for measuring current flow from a source at a first frequency using matched voltage drops in paired voltage drop circuits. The paired voltage drop circuits each comprise a fixed value component, such as a resistor, and an adjustable value component, such as an adjustable current source, coupled in series. The adjustable valued components are controlled based on differences in voltage drops produced by the voltage drop circuits based on a high-frequency signal, higher in frequency than the first frequency, applied to a control input for the adjustable value components.
A method for matching voltage drops in paired voltage drop circuits, comprising:
A method for measuring differences in voltage drop, comprising:
Apparatus for measuring voltage drop at a first frequency through a load device, comprising:
Apparatus for measuring voltage drop at a first frequency through a load device, comprising:
Dependencies are inferred from the claim text.