Sealing film and a semiconductor device using the same
AssigneeHitachi Chemical Company, Ltd.
InventorsHiroyuki KAWAKAMI, Katsuyasu NIIJIMA, Naoki TOMORI, Daichi TAKEMORI, Takuya IMAI
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AssigneeHitachi Chemical Company, Ltd.
InventorsHiroyuki KAWAKAMI, Katsuyasu NIIJIMA, Naoki TOMORI, Daichi TAKEMORI, Takuya IMAI
Estimating the term…
A method for sealing electrodes on a semiconductor device using a sealing film which includes a resin layer having a flow within the range of 150 to 1800 μm at 80° C., or having a resin layer with a viscosity within the range of 10,000 to 100,000 Pa·s in a B-stage state at 50 to 100° C. in thermosetting viscoelasticity measurement, and containing: (A) both (a1) a high-molecular-weight component including crosslinking functional groups and having a weight-average molecular weight of 100,000 or more and a Tg within the range of −50 to 50° C. and (a2) a thermosetting component including an epoxy resin as a main component, (B) a filler having an average particle size within the range of 1 to 30 μm, and (C) a colorant.
A method for sealing electrodes on a semiconductor using a sealing film, comprising the steps of:
A method for sealing electrodes on a semiconductor using a sealing film, comprising the steps of:
Dependencies are inferred from the claim text.