Solid-state imaging apparatus, image processing apparatus, and camera system
AssigneePanasonic Corporation
InventorNozomi Tanaka
Life of this patent
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Abstract
An imaging section outputs n pixel signals every pixel row of n×m pixels, and n AD conversion sections, corresponding to n pixel columns of the n×m pixels, convert the n pixel signals to n pixel values. A resolution control section controls the n AD conversion sections so that the AD conversion resolution of the n AD conversion sections become a first resolution, or a second resolution rougher than the first resolution, based on the AD conversion resolution of the n AD conversion sections and the n pixel values.
Claims11
A solid-state imaging apparatus, comprising:
- an imaging section having n×m pixels arranged in a matrix each configured to store a charge corresponding to incident light, the imaging section outputting, every pixel row of the n×m pixels, n pixel signals corresponding to charges stored in n pixels belonging to the pixel row;
- a reference signal supply section configured to supply a ramp signal and capable of changing the gradient of the ramp signal;
- n AD conversion sections corresponding to n pixel columns of the n×m pixels, each configured to count the time taken until the signal level of the ramp signal from the reference signal supply section reaches the signal level of the pixel signal from the corresponding pixel column, thereby converting the pixel signal to a pixel value;
- and
- a resolution control section configured to control the reference signal supply section so that, in the case that the gradient of the ramp signal is a first gradient, the gradient be changed to a second gradient steeper than the first gradient when having detected a pixel value larger than a first threshold among the n pixel values obtained by the n AD conversion sections, and control the reference signal supply section so that, in the case that the gradient of the ramp signal is the second gradient, the gradient be changed to the first gradient when having detected that the maximum pixel value among the n pixel values obtained by the n AD conversion sections is smaller than a second threshold that is smaller than the first threshold.
A solid-state imaging apparatus, comprising:
- an imaging section having n×m pixels arranged in a matrix each configured to store a charge corresponding to incident light, the imaging section outputting, every pixel row of the n×m pixels, n pixel signals corresponding to charges stored in n pixels belonging to the pixel row;
- a reference signal supply section configured to supply n ramp signals and capable of changing the gradient of each of the n ramp signals;
- n AD conversion sections corresponding to n pixel columns of the n×m pixels, each configured to count the time taken until the signal level of the corresponding ramp signal among the n ramp signals reaches the signal level of the pixel signal from the corresponding pixel column, thereby converting the pixel signal to a pixel value;
- and
- a resolution control section configured to control the reference signal supply section for each of the n AD conversion sections so that, in the case that the gradient of the ramp signal corresponding to the AD conversion section is a first gradient, the gradient be changed to a second gradient steeper than the first gradient when having detected that the pixel value obtained by the AD conversion section is larger than a first threshold, and control the reference signal supply section so that, in the case that the gradient of the ramp signal corresponding to the AD conversion section is the second gradient, the gradient be changed to the first gradient when having detected that the pixel value obtained by the AD conversion section is smaller than a second threshold that is smaller than the first threshold.
A solid-state imaging apparatus, comprising:
- an imaging section having n×m pixels arranged in a matrix each configured to store a charge corresponding to incident light, the imaging section outputting, every pixel row of the n×m pixels, n pixel signals corresponding to charges stored in n pixels belonging to the pixel row;
- n AD conversion sections corresponding to n pixel columns of the n×m pixels, each configured to convert the pixel signal from the corresponding pixel column to a pixel value and capable of changing AD conversion resolution;
- and
- a resolution control section configured to control the n AD conversion sections so that, in the case that the AD conversion resolution of the n AD conversion sections is a first resolution, the AD conversion resolution be changed to a second resolution rougher than the first resolution when having detected a pixel value larger than a first threshold among the n pixel values obtained by the n AD conversion sections, and control the n AD conversion sections so that, in the case that the AD conversion resolution of the n AD conversion sections is a second resolution, the AD conversion resolution be changed to the first resolution when having detected that the maximum pixel value among the n pixel values obtained by the n AD conversion sections is smaller than a second threshold that is smaller than the first threshold.
Dependencies are inferred from the claim text.