X-ray source with selective beam repositioning

A system, comprising an x-ray source, wherein the x-ray source includes:

• an electron source configured to emit a beam of electrons;
• a repositioning mechanism configured to selectively reposition the beam of electrons on a surface of a target based on a feedback parameter, wherein a location of the beam of electrons on the surface of the target defines a spot size of x-rays output by the x-ray source;
• the target configured to provide a transmission source of the x-rays in response to receiving the beam of electrons;
• and
• a beam-parameter detector configured to provide the feedback parameter during operation of the x-ray source based on a physical characteristic associated with the beam of electrons, the x-rays output by the x-ray source or both.

A method for providing a feedback parameter, the method comprising:

• emitting a beam of electrons from an electron source;
• selectively reposition the beam of electrons to different locations on a surface of the target using a repositioning mechanism based on a feedback parameter, wherein a location of the beam of electrons on the surface of the target defines a spot size of x-rays output by the x-ray source;
• in response to receiving the beam of electrons at the target, providing the transmission source of x-rays;
• and
• during operation of the x-ray source, providing the feedback parameter using a beam-parameter detector based on a physical characteristic associated with the beam of electrons, the x-rays output by the x-ray source or both.