US 2012/0269252 A1 · Minimal Reconfiguration Spectrum Stitching with Overlapped Bands

Abstract

Embodiments of this invention include a test and measurement instrument and associated methods for acquiring and stitching wide overlapped non-uniform frequency bands so that a user specified band can be efficiently displayed and analyzed. The test and measurement instrument includes a user interface to receive the user specified frequency span. Acquisition circuitry acquires one or more predefined frequency bands having non-uniform overlapping frequency ranges. A frequency band processing section can decimate the acquired frequency bands, mask the acquired frequency bands, and stitch the masked frequency bands together. A display section displays the user specified frequency span using the stitched frequency bands. Due to the overlap configuration of the wide non-uniform bands, any user specified span between 50 kHz and 6 GHz, or thereabout, can be covered by two bands.

Claims25

Dependent claims

A test and measurement instrument, comprising:

an RF input terminal;
an attenuator coupled to the RF input terminal and structured to receive one or more input signals under test;
a low band filtered path, a mid band filtered path, and a high band filtered path, each of the filtered paths capable of being coupled to the attenuator;
and
a switch coupled to the attenuator and structured to divert the one or more input signals to at least one of the low band filtered path, the mid band filtered path, and the high band filtered path, to produce a low frequency band, a mid frequency band, and a high frequency band, respectively,
wherein the low frequency band, the mid frequency band, and the high frequency band are of non-uniform overlapping frequency ranges.

3 more elements

Dependencies are inferred from the claim text.

Minimal Reconfiguration Spectrum Stitching with Overlapped Bands

Life of this patent

Minimal Reconfiguration Spectrum Stitching with Overlapped Bands

Life of this patent

Abstract

Claims25