Systems and methods for testable current limiting with hiccup reset

A current limiter apparatus having a line side input and a load side output, the apparatus comprising:

• a current regulating circuit having a pass transistor that couples the line side input to the load side output, wherein a load current delivered to the load side output flows through the pass transistor, and wherein the current regulating circuit is configured to clamp the load current to a predefined current limit when the load current exceeds a current limiting threshold;
• a latch regulating circuit coupled to the current regulating circuit, the latch regulating circuit further coupled to the line side input through a semiconductor device having a turn-on voltage threshold higher than the pass transistor;
• wherein the latch regulating circuit compares a first voltage received from the current regulating circuit to a second voltage measured at the semiconductor device to determine when the load current exceeds the current limiting threshold;
• wherein when the load current exceeds the current limiting threshold for a period of time exceeding a predetermined current limiting duration, the latch regulating circuit temporarily shuts off the pass transistor for a predetermined latching period;
• and
• a current limit test circuit coupled to the load side output, the current limit test circuit including a reference impedance and a switching device, wherein the switching device is configured to apply the reference impedance to the load side output.