US 2012/0259234 A1 · METHOD AND DEVICE FOR DETECTING INCIPIENT A-V NODE MALFUNCTION

Abstract

The present invention generally relates to implantable stimulation devices, such as pacemakers, defibrillators, and cardioverters, and, in particular, to implantable medical devices using atrial based pacing such as an AAI pacing mode and methods for such implantable medical devices for detecting early stages of incipient A-V node malfunction as well as presence of A-V node malfunction. An AV conduction capacity is detected, wherein a sensed ventricular event following an intrinsic or paced atrial event during a predetermined period of time indicates good AV conduction capacity and wherein absence of a ventricular event within the predetermined period of time indicates poor AV conduction capacity. At least one A-V node function parameter indicating a function of the A-V node is determined, wherein the A-V node function parameter includes whether a status of the AV conduction capacity is good or poor. Incipient A-V node malfunction is detected where poor AV conduction capacity indicates incipient A-V node malfunction.

Claims26

Dependent claims

A method for detecting incipient A-V node malfunction of a patient comprising:

sensing far-field ventricular events and intrinsic or paced atrial events;
determining whether a far field ventricular event following intrinsic or paced atrial events is sensed during a predetermined period of time;
detecting AV conduction capacity based on whether far field ventricular events following intrinsic or paced atrial events are sensed, wherein a sensed far field ventricular event following an intrinsic or paced atrial event during a predetermined period of time indicates good AV conduction capacity and wherein absence of a far field ventricular event within the predetermined period of time indicates poor AV conduction capacity;
determining at least one A-V node function parameter indicating a function of the A-V node, said A-V node function parameter including whether a status of said AV conduction capacity is good or poor;
and
detecting incipient A-V node malfunction based on said A-V node function parameter.

3 more elements

An implantable medical device capable of detecting incipient A-V node malfunction of a patient, said device being connectable to at least one sensor for sensing far-field ventricular events and intrinsic or paced atrial events, said device further comprising:

a cardiac event detection module adapted to determine whether a far-field ventricular event following intrinsic or paced atrial events are sensed during a predetermined period of time;
detect an AV conduction capacity based on whether far-field ventricular events following intrinsic or paced atrial events are sensed, wherein a sensed far-field ventricular event following an intrinsic or paced atrial event during a predetermined period of time indicates good AV conduction capacity and wherein absence of a far-field ventricular event within the predetermined period of time indicates poor AV conduction capacity;
and
an A-V node function detection module adapted to determine at least one A-V node function parameter indicating a function of the A-V node, said A-V node function parameter including whether a status of said AV conduction capacity is good or poor;
and
detect incipient A-V node malfunction based on said A-V node function parameter.

3 more elements

Dependencies are inferred from the claim text.

Method and device for detecting incipient a-v node malfunction

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Method and device for detecting incipient a-v node malfunction

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Abstract

Claims26