Design, layout, and manufacturing techniques for multivariant integrated circuits
AssigneeNVIDIA Corporation
InventorBrian Kelleher
Life of this patent
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AssigneeNVIDIA Corporation
InventorBrian Kelleher
Estimating the term…
Techniques for the integral design, layout, and manufacture of integrated circuits include designing an integrated circuit that includes one variant having a plurality of a modular circuits communicatively coupled together and a second variant having a sub-set of the plurality of modular circuits. The modular circuits are then laid out on a wafer for fabricating each of the variants of the integrated circuit. The layout includes primary scribe boundaries separating each set of the plurality of modular circuits of the first variant. The layout also includes secondary scribe boundaries separating the sub-set of the plurality of modular circuits of the second variant from the other modular circuits in the first variant. The layout further includes routing communicative couplings between the sub-set of the modular circuits of the second variant to the other modular circuits of the first variant in one or more metallization layers to be fabricated last. Fabricating the integrated circuit is then started, up to but not including the one or more metallization layers to be fabricated last, according to the layout. A demand for each of the integrated circuit variants is predicted during fabrication of the integrated circuit up to but not including the one or more metallization layers to be fabricated last. One or more of the plurality of variants of the integrated circuit is selected based upon the predicted demand. Fabrication then continues with the last one or more metallization layers of the integrated circuit according to the layout of the selected one or more variants of the integrated circuit. The wafer is then singulated into a plurality of integrated circuit die according to the layout of the selected one or more variants of the integrated circuit.
A method comprising:
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Dependencies are inferred from the claim text.