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US 2012/0257462 A1Published application
Repair method and integrated circuit using the same
AssigneeHynix Semiconductor Inc.
InventorYong Deok CHO
Life of this patent
Estimating the term…
Abstract
An integrated circuit includes: a memory controller configured to determine whether a memory cell included in a semiconductor memory device is defective or not and extract a fail address having positional information of the defective memory cell, in a test mode; and a fail address storage unit configured to store the fail address.
Claims18
An integrated circuit comprising:
- a memory controller configured to determine whether a memory cell included in a semiconductor memory device is defective or not and extract a fail address having positional information of the defective memory cell, in a test mode;
- and
- a fail address storage unit configured to store the fail address.
A repair method of an integrated circuit, comprising:
- determining whether a memory cell included in a semiconductor memory device is defective or not and extracting a fail address having positional information of the memory cell, in a test mode;
- and
- replacing the memory cell corresponding to the fail address with a redundant cell.
Dependencies are inferred from the claim text.