Semiconductor memory device
AssigneeNEC Corporation
InventorKoichi Takeda
Life of this patent
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AssigneeNEC Corporation
InventorKoichi Takeda
Estimating the term…
A semiconductor memory device having a read word line, a write word line and a sub-word driver operable to select the read word line using a main word signal and an inverse read block signal. The sub-word line selects the write word line using the main word signal and an inverse write block signal. The sub-word driver has a first inverter circuit using the main word signal as an input and outputting the read word line. The sub-word driver has a first transistor having a drain, a source, and a gate connected to the read word line, a low potential power source, and the inverse write block signal, respectively, and a second transistor having a drain, a source, and a gate connected to a power source terminal of the first inverter circuit, a power source, and the inverse write block signal, respectively, and can select the write word line.
A semiconductor memory device characterized by comprising:
The semiconductor memory device as recited in claim 2, characterized in that said low potential power source is set to be a first low level potential for a non-selected block and a second low level potential lower than said first low level potential for a selected block during a writing cycle.
A method of holding data in a semiconductor memory device having a memory cell, characterized in that said memory cell comprises an inverter circuit using a second storage node as an input and a first storage node as an output, a load transistor connected between a power source and said second storage node using said first storage node as an input, and holding control means connected to said second storage node;
A method of reading from a semiconductor memory device having a memory cell, characterized in that said memory cell comprises an inverter circuit using a second storage node as an input and a first storage node as an output, a load transistor connected between a power source and said second storage node using said first storage node as an input, and an access transistor connected between said first storage node and a read bit line;
A method of writing to a semiconductor memory device having a memory cell, characterized in that said memory cell comprises an inverter circuit using a second storage node as an input and a first storage node as an output, a load transistor connected between a power source and said second storage node using said first storage node as an input, a first access transistor connected between said second storage node and a write bit line, and a second access transistor connected between said first storage node and a read bit line;
A method of writing to a semiconductor memory device having a memory cell, characterized in that said memory cell comprises an inverter circuit using a second storage node as an input and a first storage node as an output, a load transistor connected between a power source and said second storage node using said first storage node as an input, a first access transistor connected between said second storage node and a ground potential, and a second access transistor connected between said first storage node and a read bit line;
A semiconductor memory device having a memory cell, characterized in that:
A semiconductor memory device having a memory cell, characterized in that:
Dependencies are inferred from the claim text.