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AssigneeApple Inc.
InventorsJustin Gregg, Adil Syed, Tomoki Takeya
Estimating the term…
A test station may include a test host, a tester, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the tester to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The tester may broadcast downlink test signals in parallel to the multiple DUTs. The DUTs may simultaneously synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the tester to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the tester is lowered. Simultaneously downlink sensitivity testing may be performed for multiple modulation schemes and data rates for any communications protocol.
A method of performing downlink sensitivity testing on a plurality of devices under test with a test station, wherein the test station includes a tester and a test chamber in which the plurality of devices under test are tested, the method comprising:
A method of testing a plurality of devices under test with a test station, the method comprising:
A method of performing downlink sensitivity testing on a plurality of devices under test with a test station, wherein the test station includes a tester and a test chamber in which the plurality of devices under test are tested and wherein each of the plurality of devices under test includes counter circuitry, the method comprising:
Dependencies are inferred from the claim text.