Ram single event upset (seu) method to correct errors
AssigneeHamilton Sundstrand Corporation
InventorsRobert E. Cox, James A. Gosse, Kimberly K. Sendlein, David S. Harman
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AssigneeHamilton Sundstrand Corporation
InventorsRobert E. Cox, James A. Gosse, Kimberly K. Sendlein, David S. Harman
Estimating the term…
An error detection and correction (EDAC) circuit mitigates the effect of single event upsets (SEU) events in a redundant memory system. The EDAC circuit includes a first input for receiving first data and parity information stored by a first memory device and a second input for receiving second data and parity information stored by a second memory device. First parity check logic calculates parity for the received first data and parity information. Second parity check logic calculates parity for the received second data and parity information. Bit comparison logic detects differences between the first data and the second data, and between the first parity information and the second parity information. Based on the parity check calculated for the first and second data, and the bit comparison, data select logic selects either the first data or the second data for provision to a data bus.
An error detection and correction (EDAC) circuit for use in a redundant memory system, the EDAC circuit comprising:
A method of reducing single event upset (SEU) errors in memory systems with an error detection and correction (EDAC) circuit, the method comprising:
A redundant memory system comprising:
Dependencies are inferred from the claim text.