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US 2012/0084613 A1Published application
Scan response reuse method and apparatus
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
Life of this patent
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Abstract
The disclosure describes a novel method and apparatus for allowing response data output from the scan outputs of a circuit under test to be formatted and applied as stimulus data input to the scan inputs of the circuit under test. Also the disclosure described a novel method and apparatus for allowing the response data output from the scan outputs of a circuit under test to be formatted and used as expected data to compare against the response data output from the circuit under test. Additional embodiments are also provided and described in the disclosure.
Claims2
A circuit comprising:
- A. combinational logic;
- B. scan paths having leads connected to the combinational logic that carry stimulus signals and response signals, there being a first scan path, intermediate scan paths, and a last scan path, each scan path having a serial scan data input, a serial scan data output, a scan enable input, and a scan clock input;
- C. a serial data output lead connected to the serial scan data output of the last scan path;
- D. a serial data input lead;
- E a serial mode input lead;
- F. one scan data input lead for each scan path;
- G. one multiplexer circuit for each scan path, each multiplexer circuit having a control lead connected to the serial mode input lead:
- i. a first multiplexer having one input connected to the serial data input lead, another input connected to a scan data input lead, and an output connected to the serial scan data input of the first scan path;
- ii. the remaining multiplexers having one input connected to the serial scan data output of a preceding scan path, another input connected to a scan data input lead, and an output connected to a serial scan data input of an intermediate scan path and the last scan path.
6 more elements
Dependencies are inferred from the claim text.