Real-Time Prognostic on Downhole Printed Circuit Board Assembly of Measurement-While-Drilling/Logging-While-Drilling

Abstract

A method and apparatus for estimating a time to failure of an electronic component used in a downhole environment is disclosed. A stress is applied to the electronic component to cause failure of a plurality of prognostic sensors associated with the electronic component, wherein the stress level at which a prognostic sensor fails is indicative of a stress level at which the electronic component fails. Failure times are obtained due to the applied stress for the plurality of prognostic sensors. A trend is determined from the obtained failure times of the prognostic sensors. The time of failure of the electronic component is estimated from the determined trend.

Dependencies are inferred from the claim text.