Semiconductor memory device and method for driving the same
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorYasuhiko Takemura
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorYasuhiko Takemura
Estimating the term…
In a conventional DRAM, when the capacitance of a capacitor is reduced, an error of reading data easily occurs. A plurality of cells are connected to one bit line MBL_m. Each cell includes a sub bit line SBL_n_m and 4 to 64 memory cells (a memory cell CL_n_m—1 or the like). Further, each cell includes selection transistors STr1_n_m and STr2_n_m and an amplifier circuit AMP_n_m that is a complementary inverter or the like is connected to the selection transistor STr2_n_m. Since parasitic capacitance of the sub bit line SBL_n_m is sufficiently small, potential change due to electric charge in a capacitor of each memory cell can be amplified by the amplifier circuit AMP_n_m without an error, and can be output to the bit line.
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A method for driving a semiconductor memory device comprising:
Dependencies are inferred from the claim text.