Methods and systems for quantifying degradation of wiring insulation

A device for engaging an in circuit wire for the purpose of determining a degradation of the insulation associated with the wire, said device comprising:

• a clamp for engaging the wire to be tested, said clamp comprising a first jaw and a second jaw, said first jaw and said second jaw each comprising a half-channel formed therein along a longitudinal axis of said jaws, said jaws configured for placement adjacent one another in a first position such that said half-channels in combination form a channel for placement of the wire to be tested, said jaws configured for placement apart from one another in a second position for insertion and removal of the wire to be tested;
• and
• a plurality of plates placed within both of said half-channels, said plates comprising a first plurality of said plates electrically connected at a ground electrical potential and a second plurality of said plates electrically connected at a potential other than ground, said plates from said first plurality alternated with said plates from said second plurality in both said first jaw and said second jaw such that wire insulation placed within said half-channels provides a dielectric for a capacitor formed by said first plurality of plates and said second plurality of plates.