Variable resistance nonvolatile storage device
AssigneePanasonic Corporation
InventorsKazuhiko SHIMAKAWA, Yoshihiko Kanzawa, Satoru Mitani, Shunsaku Muraoka
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AssigneePanasonic Corporation
InventorsKazuhiko SHIMAKAWA, Yoshihiko Kanzawa, Satoru Mitani, Shunsaku Muraoka
Estimating the term…
The variable resistance nonvolatile storage device includes a memory cell (300) that is formed by connecting in series a variable resistance element (309) including a variable resistance layer (309b) which reversibly changes based on electrical signals each having a different polarity and a transistor (317) including a semiconductor substrate (301) and two N-type diffusion layer regions (302a, 302b), wherein the variable resistance layer (309b) includes an oxygen-deficient oxide of a transition metal, lower and upper electrodes (309a, 309c) are made of materials of different elements, a standard electrode potential V1 of the lower electrode (309a), a standard electrode potential V2 of the upper electrode (309c), and a standard electrode potential Vt of the transition metal satisfy Vt<V2 and V1<V2, and the lower electrode (309a) is connected with the N-type diffusion layer region (302b), the electrical signals being applied between the lower and upper electrodes (309a, 309c).
A variable resistance nonvolatile storage device comprising:
Dependencies are inferred from the claim text.