Surface Analyzer
AssigneeShimadzu Corporation
InventorsTakashi MORIMOTO, Akinori KOGURE
Life of this patent
Estimating the term…
Loading patent…
AssigneeShimadzu Corporation
InventorsTakashi MORIMOTO, Akinori KOGURE
Estimating the term…
A surface analyzer with which users only need to perform simple operations to quantitatively compare different physical quantities, such as the altitude and phase, in a region of interest on a sample is provided. A three-dimensional color image created by mapping color information corresponding to the phase onto a three-dimensional image created from two-dimensional distribution data of a sample's altitude is displayed in an analysis result display screen. A section image is superposed on the three-dimensional color image. The one-dimensional area at which the section image intersects the sample is defined as the region of interest. The altitude and phase along this region of interest are graphically shown on the graph display area. Various characteristic values at the position of these cursors, such as the altitude and phase values or the difference in these values between two cursors, are displayed in a characteristic value table.
A surface analyzer for collecting two-dimensional distribution data of a plurality of different kinds of physical quantities on a same target area of a sample, for creating a display image based on the collected data, and for showing the display image on a display device, comprising:
Dependencies are inferred from the claim text.