Deflection measuring device according to the interferometer principle

Deflection measuring device according to the interferometer principle, comprising:

• a radiation source,
• a first fiber-optic means for forming a first light path,
• a second fiber-optic means for forming a second light path,
• a deflection body and
• an evaluation circuit,
• wherein the first fiber-optic means and the second fiber-optic means are positioned to be impinged with interference-capable radiation from the radiation source on an input side,
• wherein at least the first fiber-optic means is connected to the deflection body,
• wherein a first partial radiation beam guided in the first fiber-optic means and a second partial radiation beam guided in the second fiber-optic means are connected on an output side in a manner causing interference radiation to be conveyed to the evaluation circuit and evaluated by the evaluation circuit, and
• wherein the first fiber-optic means and the second fiber-optic means are arranged only on the deflection body, at least one of the first fiber-optic means and the second fiber-optic means being connected on the input side to the radiation source with a single feed optical fiber and at least one of the first fiber-optic means and the second fiber-optic means is connected on the output side to the evaluation circuit with a single evaluation optical fiber.