Method of manufacturing semiconductor device
AssigneeRenesas Electronics Corporation
InventorsShigeki TANAKA, Atsushi Fujisawa, Masahiro Tani, Satoru Suzuki
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AssigneeRenesas Electronics Corporation
InventorsShigeki TANAKA, Atsushi Fujisawa, Masahiro Tani, Satoru Suzuki
Estimating the term…
The occurrence of a resin seal failure is suppressed. A molding step is carried out using a lead frame in which there are formed multiple air vent portions for discharging gas in each cavity formed in the upper die of a molding die to outside the cavity. The air vent portions are formed at positions overlapping with the other corner portions, arranged inside a gate portion of the cavity. Each of the air vent portions is led out from the other corner portions of the cavity to outside a clamp area and is extended along sides of the cavity, respectively, in the clamp area.
A method of manufacturing a semiconductor device comprising the steps of:
A method of manufacturing a semiconductor device comprising the steps of:
Dependencies are inferred from the claim text.