Application of open and/or short structures to bisect de-embedding
AssigneeMayo Foundation for Medical Education and Research
InventorsMichael J. Degerstrom, Erik S. Daniel
Life of this patent
Estimating the term…
Abstract
Application of open and short structures may result in improved accuracy in determination of ABCD parameters of a substantially symmetric THRU for purposes of bisect de-embedding. Either one or both of the open and/or short techniques may be used to improve results of an ABCD optimization algorithm. Bisect de-embedding may then be performed to determine the ABCD parameters of a device under test based on the ABCD parameters of the substantially symmetric THRU and measured s-parameters of the substantially symmetric THRU and the embedded device under test.
Claims17
A method comprising:
- measuring transmission characteristics of a substantially symmetric THRU including a first half and a second half;
- measuring at least one of transmission characteristics of the first half of the substantially symmetric THRU having a short-circuited output and transmission characteristics of the first half of the substantially symmetric THRU having an open-circuited output;
- and
- determining transmission characteristics of the substantially symmetric THRU based on the transmission characteristics of the substantially symmetric THRU and one or both of the transmission characteristics of the first half of the substantially symmetric THRU having a short-circuited output and the transmission characteristics of the first half of the substantially symmetric THRU having an open-circuited output.
A method comprising:
- measuring a first set of s-parameters of a substantially symmetric THRU including a first half and a second half;
- measuring at least one of a second set of s-parameters of the first half of the substantially symmetric THRU having a short-circuited output and a third set of s-parameters of the first half of the substantially symmetric THRU having an open-circuited output;
- and
- determining ABCD parameters of the substantially symmetric THRU based on the first set of s-parameters and one or both of the second and third set of s-parameters.
A method comprising:
- measuring transmission characteristics of a first substantially symmetric THRU structure including a first half and a second half;
- measuring transmission characteristics of the first half of the first substantially symmetric THRU structure having one of a short-circuited output or an open circuited output;
- measuring transmission characteristics of a second substantially symmetric THRU structure including a first half and a second half;
- measuring transmission characteristics of the first half of the second substantially symmetric THRU structure having one of a short-circuited output or an open circuited output;
- and
- measuring transmission characteristics of a measurement structure containing a device under test embedded between the first half of the first substantially symmetric THRU structure and the second half of the second substantially symmetric THRU structure.
A computer-readable medium comprising instructions to cause a processor to:
- measure transmission characteristics of a substantially symmetric THRU including a first half and a second half;
- measure at least one of transmission characteristics of the first half of the substantially symmetric THRU having a short-circuited output and transmission characteristics of the first half of the substantially symmetric THRU having an open-circuited output;
- and
- determine transmission characteristics of the substantially symmetric THRU based on the transmission characteristics of the substantially symmetric THRU and one or both of the transmission characteristics of the first half of the substantially symmetric THRU having a short-circuited output and the transmission characteristics of the first half of the substantially symmetric THRU having an open-circuited output.
Dependencies are inferred from the claim text.