Method of manufacturing semiconductor apparatus
AssigneeFuji Electric Co., Ltd.
InventorYuichi URANO
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AssigneeFuji Electric Co., Ltd.
InventorYuichi URANO
Estimating the term…
A method of manufacturing a semiconductor apparatus includes forming back surface electrode 4 on back surface of semiconductor wafer 20, that bends convexly toward the front surface side due to back surface electrode 4 being formed; treating the back surface with a plasma for removing the deposits on the back surface; sticking removable adhesive tape 23 to the back surface along the warp thereof for maintaining the bending state of semiconductor wafer 20 after the step of sticking; electrolessly plating to form film 26 on the front surface of semiconductor wafer 20; peeling off removable adhesive tape 23; cutting out semiconductor chips; and mounting the semiconductor chip by bonding with a solder for manufacturing a semiconductor apparatus. The manufacturing method prevents external appearance anomalies from occurring on the back surface electrode, improves the reliability, and allows manufacture of the semiconductor apparatuses with a high throughput of non-defective products.
A method of manufacturing a semiconductor apparatus, the method comprising:
A method of manufacturing a semiconductor apparatus, the method comprising:
A method of manufacturing a semiconductor apparatus, the method comprising:
Dependencies are inferred from the claim text.