Automatic analyzer
AssigneeHitachi High-Technologies Corporation
InventorsMasashi Akutsu, Shigeki Matsubara, Yoshimitsu Takagi, Hitoshi Tokieda
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Technologies Corporation
InventorsMasashi Akutsu, Shigeki Matsubara, Yoshimitsu Takagi, Hitoshi Tokieda
Estimating the term…
An automatic analyzer is provided that can promptly process a request for additional test items for a sample being analyzed or an error that has occurred in the sample. The automatic analyzer has functions of outputting measurements of a sample analyzed, determining whether or not re-analyzing is necessary, and performing the re-analyzing. To achieve these functions, the automatic analyzer includes a buffer area for standby until analysis is completed and measurements are outputted. Each of analysis units includes a pair of buffer units that can randomly access the buffer area. The automatic analyzer further includes a position disposed near the buffer area, at which a sample can be unloaded and reloaded. A rack that is mounted with the sample in question and that stands by within the buffer area is unloaded onto the unloading position by a command to unload issued by an operator operating an operation section. Operations required for the sample are performed from above the unloaded rack. Subsequent reloading of the sample allows samples other than the sample in question to be analyzed continuously.
An automatic analyzer comprising:
Dependencies are inferred from the claim text.