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US 2011/0254569 A1Published application
Measurement apparatus
OwnerPeter BOGNER, Franz KUTTNERinventors
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Abstract
Measurement apparatuses and methods are described. A measurement input is coupled with a first terminal of a capacitance via a first switch, and a reference voltage is coupled with the first terminal of the capacitance via a second switch. A measurement circuit is coupled to a second terminal of said capacitance.
Claims23
A device, comprising:
- a first switch coupled between a measurement input and a node,
- a second switch coupled between the node and a reference voltage,
- a capacitance, a first terminal of the capacitance being coupled with the node, and
- a measurement circuit, a terminal of said measurement circuit being coupled with a second terminal of said capacitance.
1 more element
An apparatus, comprising:
- a first capacitance,
- a voltage input coupled with a first terminal of said first capacitance via a first switch,
- a reference voltage coupled to said first terminal of said first capacitance via a second switch,
- a comparator, a first input of said comparator being coupled with a second terminal of said first capacitance,
- a successive approximation register coupled with an output of said comparator, and
- an array of second capacitances, a first terminal of each of said second capacitances being coupled with said first input of said comparator, and a second terminal of said second capacitances being selectively coupled with a further reference voltage.
3 more elements
A method, comprising:
- alternately applying an input voltage and a reference voltage to a first input of a capacitor,
- coupling a second terminal of said capacitor to a comparator, and
- determining a bit value of an output signal based on an output of said comparator.
Dependencies are inferred from the claim text.