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US 2011/0235738 A1Published application
System and method for generating test patterns of baseline wander
AssigneeHimax Media Solutions, Inc.
InventorTIEN-JU TSAI
Life of this patent
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Abstract
A system and method for generating test patterns of baseline wander, such as worst-case test patterns commonly referred to as killer packets. The number of steps required to cycle an output of a multi-level encoder in order to arrive at an anticipated level is determined. A test packet generator then generates the test patterns according to the determined steps and the state of a scrambler.
Claims22
A system for generating test patterns of baseline wander, comprising:
- a scrambler configured to generate scram bits;
- a multi-level encoder configured to cycle through a plurality of states;
- and
- a test packet generator configured to generate the test patterns according to a state of the scrambler and the state of the multi-level encoder.
1 more element
A method for generating test patterns of baseline wander, comprising:
- determining a number of steps required to cycle an output of a multi-level encoder in order to arrive at an anticipated level;
- and
- generating the test patterns according to the determined steps and a state of a scrambler.
Dependencies are inferred from the claim text.