Non-volatile semiconductor storage device
AssigneeRenesas Electronics Corporation
InventorsTetsuya ISHIMARU, Yasuhiro Shimamoto, Hideo Kasai, Yutaka Okuyama, Tsuyoshi Arigane
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AssigneeRenesas Electronics Corporation
InventorsTetsuya ISHIMARU, Yasuhiro Shimamoto, Hideo Kasai, Yutaka Okuyama, Tsuyoshi Arigane
Estimating the term…
In a split gate MONOS memory which carries out rewrite by hot carrier injection, retention characteristics are improved. A select gate electrode of a memory cell is connected to a select gate line, and a memory gate electrode is connected to a memory gate line. A drain region is connected to a bit line, and a source region is connected to a source line. Furthermore, a well line is connected to a p type well region in which the memory cell is formed. When write to the memory cell is to be carried out, write by a source side injection method is carried out while applying a negative voltage to the p type well region via the well line.
A non-volatile semiconductor storage device comprising:
A non-volatile semiconductor storage device comprising:
Dependencies are inferred from the claim text.