Electrically programmable fuse bit

A one-time programmable memory circuit comprising:

• a single-bit core memory means for storing a single data bit, wherein the data bit is programmed in the memory means by permanently altering capacitance of a fuse device;
• a single-bit latch means for latching an output of the single-bit core memory means or latching an externally provided data bit, wherein:
• the single-bit latch is implemented by two cross-coupled NAND-gates;
• the fuse data is connected to the single-bit latch through at least one transistor and a signal at the transistor gate controls the fuse data passage;
• and
• an input of the single-bit latch is connected to ground through at least one transistor, a gate of which is controlled by the fuse data and is also connected to ground by at least one leakage control transistor;
• a set and a reset means for controlling the single-bit latch content;
• a block-select input means for selecting a block of multiple memory circuits among a plurality of memory circuit blocks;
• multiple address input means for selecting a memory circuit among multiple memory circuits of a memory circuit block;
• and
• a programming input means for enabling programming of memory circuits of a selected memory circuit block.