Test method for passive device embedded printed circuit board
AssigneeSamsung Electro-Mechanics Co., Ltd.
InventorsHyun-Ho KIM, Won-Geun Jung, Yul-Kyo Chung
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Abstract
A method of testing a passive device embedded printed circuit board is disclosed. The method in accordance with an embodiment of the present invention includes: applying an AC power to a printed circuit board in which a filter including at least two of a resistor, an inductor and a capacitor is embedded; measuring a property of the filter for the applied AC power; and determining whether or not the printed circuit board is defective by comparing the measured property of the filter with a design value.
Claims5
A method of testing a passive device embedded printed circuit board, the method comprising:
- applying an AC power to a printed circuit board in which a filter including at least two of a resistor, an inductor and a capacitor is embedded;
- measuring a property of the filter for the applied AC power;
- and
- determining whether or not the printed circuit board is defective by comparing the measured property of the filter with a design value.
Dependencies are inferred from the claim text.