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US 2011/0210748 A1Published application
Semiconductor integrated circuit and electronic information device
AssigneePanasonic Corporation
InventorsRyota NISHIKAWA, Hideyuki Kabuo
Life of this patent
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Abstract
A semiconductor integrated circuit and an electronic information device each of which can detect a fault at one of control signals of tristate gates with a smaller area than conventional ones and without reducing the speed of normal operation, by providing a fault detector using tristate gates.
Claims8
A semiconductor integrated circuit comprising:
- a fault detector configured to receive control signals which are input to control terminals of corresponding tristate gates, and a test enable signal, and configured to invert an output signal when one of the control signals is inverted due to a fault at the one of the control signals,
- wherein
- the fault detector includes a set of tristate gates different from the corresponding tristate gates.
Dependencies are inferred from the claim text.