Test apparatus

Abstract

Provided is a test apparatus that tests a device under test, comprising a power supply that generates power supplied to the device under test; a transmission path that transmits the power generated by the power supply to the device under test; a current measuring section that measures a digital waveform of load current supplied to the device under test via the transmission path, the digital waveform including a frequency component higher than a frequency corresponding to a product of an inductance component of the power supply and a capacitance component between the transmission path and a ground potential; and a judging section that judges acceptability of the device under test based on the digital waveform of the load current measured by the current measuring section.

Dependencies are inferred from the claim text.