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US 2010/0302890 A1Published application
Electrical Fuse, Semiconductor Device Having the Same, and Method of Programming and Reading the Electrical Fuse
AssigneeSamsung Electronics Co., Ltd.
InventorsMyung-Hee Nam, Shigenobu Maeda, Jae-Ho Lee
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Abstract
Provided are an electrical fuse, a semiconductor device having the same, and a method of programming and reading the electrical fuse. The electrical fuse includes first and second anodes disposed apart from each other. A cathode is interposed between the first and second anodes. A first fuse link couples the first anode to the cathode, and a second fuse link couples the second anode to the cathode.
Claims6
A method of programming and reading an electrical fuse, comprising:
- preparing a semiconductor substrate comprising first and second fuse terminals disposed apart from each other, a third fuse terminal interposed between the first and second fuse terminals, a first fuse link for coupling the first fuse terminal to the third fuse terminal, and a second fuse link for coupling the second fuse terminal to the third fuse terminal;
- applying first and second voltages to the first and second fuse terminals, to respectively, and applying a third voltage lower than the first and second voltages to the third fuse terminal to blow at least one of the first fuse link and the second fuse link;
- interrupting the application of the first through third voltages;
- and
- applying a fourth voltage to the first fuse terminal and applying a fifth voltage lower than the fourth voltage to the second fuse terminal to sense the resistance of the electrical fuse.
2 more elements
Dependencies are inferred from the claim text.