Microscope

A method for calibrating a fluorescence analysis microscope in which a known sample is illuminated, the fluorescence analysis microscope comprising an illumination carrier and illumination units arranged thereon for a reflected-light illumination of a sample region, wherein at least three illumination units for the simultaneous reflected-light illumination of the sample region from different directions are arranged on the illumination carrier, each illumination unit comprises at least one illumination source, at least two of the illumination units have illumination sources which emit radiation with different wavelength ranges during operation, and the illumination sources can be driven separately by a control unit, the method comprising:

• an image of the sample is evaluated by an image processing, an undesirably illuminated partial region of the sample region is determined and at least one illumination parameter of one of the illumination units is altered by means of a stipulation obtained from the determination.