Three dimensional shape measurement apparatus and method
AssigneeKoh Young Technology Inc.
InventorsHo KIM, Kwang-Ill KHO, Hee-Wook YOU, Jae-Myeong SONG
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AssigneeKoh Young Technology Inc.
InventorsHo KIM, Kwang-Ill KHO, Hee-Wook YOU, Jae-Myeong SONG
Estimating the term…
A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.
A three dimensional shape measurement apparatus comprising:
A method of measuring a three dimensional shape comprising:
A method of measuring a three dimensional shape comprising:
A board inspection apparatus comprising:
A method of inspecting a board by using at least two projecting sections, each of which includes a light source and a grating element, and a camera, the method comprising:
A method of inspecting a board comprising:
Dependencies are inferred from the claim text.