US 2010/0251437 A1Published application

Method and Apparatus for Characterizing a Sample with Two or More Optical Traps

AssigneeJPK Instruments AG

InventorsSven-Peter Heyn, Jacob Kerssemakers, Detlef Knebel, Helge Eggert, Torsten Jaehnke, Joern Kamps

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Abstract

The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.

Claims16

Dependent claims

A method for examining a sample using scanning probe microscopy, it particular by means of scanning probe photon microscopy, comprising the following steps:

generating at least two optical traps by means of focussed light with two focussing volumes which are movable within the local area of the sample, with a probe being disposed in at least one of the two focussing volumes,
scanning the sample using the two optical traps by moving both focussing volumes relative to the sample,
obtaining measurement data which are associated with the first optical trap containing the probe, during the scanning operation,
obtaining measurement data which are associated with the second optical trap, during the scanning operation,
evaluating the measurement data by correlating the measurement data of the first and the second optical traps.

2 more elements

Dependencies are inferred from the claim text.

Facts

Application: 12/602,151Filed 30 May 2008
Priority: DE 102007025532.431 May 2007
Published: 30 Sep 2010
Term ends: Not estimatedThe source records don’t support an estimate.

Classification8 codes

G02B 21/32
Microscopes: micromanipulators structurally combined with microscopes
B82Y 35/00
Methods or apparatus for measurement or analysis of nanostructures
G01Q 10/06
Fine scanning or positioning: circuits or algorithms therefor
G01Q 30/06
Display or data processing devices: for error compensation

Family

US 8,415,613 B2Related patent
US 2010/0251437 A1This patent

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