Inspection device for disk-shaped substrate
AssigneeShibaura Mechatronics Corporation
InventorsYoshinori Hayashi, Hiroshi Wakaba, Yoko Ono, Koichi Miyazono, Hideki Mori
Life of this patent
Estimating the term…
Loading patent…
AssigneeShibaura Mechatronics Corporation
InventorsYoshinori Hayashi, Hiroshi Wakaba, Yoko Ono, Koichi Miyazono, Hideki Mori
Estimating the term…
An inspection apparatus of a disk-shaped substrate able to precisely quantitatively inspect positions of formation of film layers formed on the surface of a disk-shaped substrate is provided, that is, an inspection apparatus of a disk-shaped substrate on which film layers are formed designed to generate captured image data expressing a captured image corresponding to a field of view based on image signals successively output from an image capturing unit capturing an image of a predetermined surface at an outer circumference part of the disk-shaped substrate and to generate film layer edge position information Y4E24 (θ) expressing longitudinal direction positions at corresponding positions (θ) along the circumferential direction of an edge line E24 of a film layer image part ISa (24) corresponding to the film layer 24 on the surface image ISa with reference to, from the captured image data, longitudinal direction positions YE15aL (θ) at the different positions (θ) along the circumferential direction of a boundary line E15a between a surface image part ISa corresponding to the predetermined surface on the captured image and its outer image part IBKL.
An inspection apparatus of a disk-shaped substrate having film layers formed on its surface, which has
An inspection apparatus of a disk-shaped substrate having film layers formed on its surface, which has
An inspection apparatus of a disk-shaped substrate having
Dependencies are inferred from the claim text.