Jitter measuring apparatus
AssigneeAnritsu Corporation
InventorsNaosuke Tsuchiya, Ken Mochizuki, Seiya Suzuki
Life of this patent
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AssigneeAnritsu Corporation
InventorsNaosuke Tsuchiya, Ken Mochizuki, Seiya Suzuki
Estimating the term…
It is an object of the invention to correctly display the waveform of a demodulation signal with a single apparatus. A jitter demodulator which demodulates a jitter component of a digital signal input from the outside, a jitter amount detector which detects the amplitude value of a demodulation signal output from the jitter demodulator, an interpolator which measures a period of the demodulation signal output from the jitter demodulator and interpolates the demodulation signal processing with a rate corresponding to the measured period, a display unit, and a display control section which displays on the display unit the value detected by the jitter amount detector and a waveform of the demodulation signal interpolated by the interpolator are provided in a single housing.
A jitter measuring apparatus comprising:
A jitter measuring method comprising the steps of:
Dependencies are inferred from the claim text.