Position detection apparatus, exposure apparatus, and method of manufacturing device

An exposure apparatus that exposes a substrate via a reticle after the substrate is aligned with the reticle, the apparatus comprising:

• a position detection apparatus configured to detect a position of the substrate based on a position of an image of a mark for the alignment,
• said position detection apparatus comprising
• an imaging system configured to form an image of the mark formed on the substrate,
• an illumination system configured to illuminate the mark with illumination light emitted by a light source via a part of said imaging system, said illumination system including a rotary table having a first aperture stop for said illumination system and a second aperture stop for said illumination system, both of which can be positioned on a pupil plane of said illumination system in an optical path of the illumination light between an aperture stop for said imaging system and the light source by rotating said rotary table,
• a first image sensor configured to detect the image of the mark formed by said imaging system,
• a second image sensor configured to sense an image of the aperture stop for said imaging system and an image of said first aperture stop, and
• a controller,
• wherein said controller
• causes said second image sensor to sense an image of the aperture stop for said imaging system using the illumination light having passed through said second aperture stop positioned on the pupil plane,
• positions said first aperture stop on the pupil plane by rotating said rotary table and causes said second image sensor to sense an image of said first aperture stop using the illumination light having passed through said first aperture stop, and
• performs, a process of correcting said first aperture stop so as to reduce an adverse influence of a displacement of said first aperture stop with respect to the aperture stop for said imaging system, based on the sensed image of the aperture stop for said imaging system and the sensed image of said first aperture stop, and
• the position detection apparatus detects the position of the substrate using the illumination light having passed through said first aperture stop having undergone the correcting process.

A method of manufacturing a device, the method comprising:

• exposing a substrate to radiant energy via a reticle using an exposure apparatus;
• developing the exposed substrate;
• and
• processing the developed substrate to manufacture the device, wherein
• the exposure apparatus exposes a substrate via a reticle after the substrate is aligned with the reticle, and comprises a position detection apparatus configured to detect a position of the substrate based on a position of an image of a mark for the alignment,
• the position detection apparatus comprises
• an imaging system configured to form an image of the mark formed on the substrate,
• an illumination system configured to illuminate the mark with illumination light emitted by a light source via a part of the imaging system, the illumination system including a rotary table having a first aperture stop for the illumination system and a second aperture stop for the illumination system, both of which can be positioned on a pupil plane of the illumination system in an optical path of the illumination light between an aperture stop for the imaging system and the light source by rotating the rotary table,
• a first image sensor configured to detect the image of the mark formed by the imaging system,
• a second image sensor configured to sense an image of the aperture stop for the imaging system and an image of the first aperture stop, and
• a controller,
• the controller
• causes the second image sensor to sense an image of the aperture stop for the imaging system using the illumination light having passed through the second aperture stop positioned on the pupil plane,
• positions the first aperture stop on the pupil plane by rotating the rotary table and causes the second image sensor to sense an image of the first aperture stop using the illumination light having passed through the first aperture stop, and
• performs, a process of correcting the first aperture stop so as to reduce an adverse influence of a displacement of the first aperture stop with respect to the aperture stop for the imaging system, based on the sensed image of the aperture stop for the imaging system and the sensed image of the first aperture stop, and
• the position detection apparatus detects the position of the substrate using the illumination light having passed through the first aperture stop having undergone the correcting process.