Substrate Handling Structure
AssigneeNikon Corporation
InventorsEric Peter Goodwin, Daniel Gene Smith, Michael B. Binnard
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AssigneeNikon Corporation
InventorsEric Peter Goodwin, Daniel Gene Smith, Michael B. Binnard
Estimating the term…
A substrate handling structure is provided that is particularly useful with an imaging optical system that images a single reticle to a pair of imaging locations. The principles of the present invention provide substrate handling structures with new and useful metrology structures, and new and useful ways of moving substrates in relation to the imaging locations, that are designed to provide benefits in providing information as to the substrate position as a substrate is being imaged, while reducing the size of the support structure. These features are believed to be important as imaging of substrates in the 450 mm diameter range is developing.
A substrate handling structure for an imaging optical system of the type that images a reticle to an imaging location, where a metrology device includes a support member located under the imaging optics and under the substrate at the imaging location, and the metrology device is configured to enable the position and/or orientation of a substrate to be measured relative to the imaging optics, characterized in that the support member is supported at points on opposite sides of the imaging location.
A substrate handling structure for an imaging optical system that images a single reticle to a pair of imaging locations, comprising
A substrate handling structure for an imaging optical system that images a single reticle to a pair of imaging locations, comprising
Dependencies are inferred from the claim text.