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US 2010/0244854 A1Published application
Semiconductor device and interface board for testing the same
AssigneeHynix Semiconductor Inc.
InventorKhil-Ohk Kang
Life of this patent
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Abstract
A semiconductor device includes a common probing pad; an internal voltage generation unit having a plurality of internal voltage generation blocks configured to generate a plurality of internal voltages; and a probing voltage selection unit configured to transfer an internal voltage selected from the internal voltages to the common probing pad in response to a plurality of voltage selection signals.
Claims20
A semiconductor device, comprising:
- a common probing pad;
- an internal voltage generation unit having a plurality of internal voltage generation blocks configured to generate a plurality of internal voltages;
- and
- a probing voltage selection unit configured to transfer an internal voltage selected from the internal voltages to the common probing pad in response to a plurality of voltage selection signals.
1 more element
A test interface board, comprising:
- a plurality of common voltage input terminals configured to receive a plurality of test voltages provided through a common voltage channel of a test device;
- a plurality of test voltage transferring line group configured to be allocated to a plurality of semiconductor devices, respectively, and to each transfer the test voltages, which are applied to the common voltage input terminals, to the respective semiconductor device;
- and
- a plurality of voltage transferring pins configured to couple the test voltage transferring line groups to a plurality of power pads of each of the semiconductor devices.
1 more element
Dependencies are inferred from the claim text.