Test apparatus, calibration method, program, and recording medium
AssigneeAdvantest Corporation
InventorMASAHIRO HABU
Life of this patent
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AssigneeAdvantest Corporation
InventorMASAHIRO HABU
Estimating the term…
Provided is a test apparatus, a calibration method, a program causing a computer to perform as a test apparatus, and a recording medium storing the program. The test apparatus includes a response characteristic detecting section that detects a difference between a response time of the comparator for a rising waveform and a response time of the comparator for a falling waveform, based on measurement results, obtained by the comparator, of the waveforms and corresponding reflected waveforms, The response characteristic detecting section calculates a difference between output characteristics of the rising waveform and the falling waveform output from the driver, based on the measurement results from the comparator of the waveforms and the corresponding reflected waveforms, and corrects a difference between the response times of the comparator based on the difference between the output characteristics.
A test apparatus that tests a device under test, comprising:
A method for calibrating a test apparatus that tests a device under test, comprising:
A program causing a computer to function as a calibration apparatus that calibrates a test apparatus for testing a device under test, wherein
Dependencies are inferred from the claim text.