System and method for statistical measurment validation
AssigneeSTMicroelectronics S.r.l.
InventorSteven Srebranig
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AssigneeSTMicroelectronics S.r.l.
InventorSteven Srebranig
Estimating the term…
An apparatus and method are disclosed for a measurement system that reports as a measurement result a confidence interval associated with a histogram bin into which a measurement value falls. The confidence interval is calculated from a subset of training values that also fall within the histogram bin. A training process may be performed in which a plurality of training values is obtained and a mean and standard deviation of the values determined. A plurality of histogram bins are defined from the mean and standard deviation and, for the subsets of training values that fall into each bin, confidence intervals calculated. A need to perform the training process may be determined from a plurality of measured values.
A method, comprising:
An apparatus, comprising:
A system, comprising:
Dependencies are inferred from the claim text.