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US 2010/0169037 A1Published application
Flash memory threshold voltage characterization
AssigneeTexas Instruments Incorporated
InventorsHarland Glenn Hopkins, David J. Livingston
Life of this patent
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Abstract
In an embodiment, the invention provides a method for characterizing a threshold voltage of a flash memory cell. The method comprises generating a pulse train signal on flash memory IC, applying the pulse train signal to an external low-pass filter, and applying an output of the low-pass filter to the input of an external gain stage. An analog signal from the output of the gain stage is directed to a control gate of the flash memory cell. An electrical parameter of the flash memory cell is measured by an external tester.
Claims17
A system for testing integrated circuits comprising:
- a pulse train generator located on an integrated circuit, the pulse train generator having an input and an output;
- a CPU located on the integrated circuit, the CPU having an output and an input/output (I/O);
- a plurality of circuits located on the integrated circuit, the plurality of circuits having an input, an output and an I/O;
- test logic located on the integrated circuit, the test logic having an input and an output;
- a low-pass filter located external to the integrated circuit, the low-pass filter having an input and an output;
- a gain stage located external to the integrated circuit, the gain stage having an input and an output;
- an external tester located external to the integrated, the external tester having an input;
- wherein the output of the pulse train generator creates a pulse train signal;
- wherein the input of the pulse train generator is connected to the output of the CPU;
- wherein the pulse train signal is connected to the input of the low-pass filter;
- wherein the output of the low-pass filter is connected to an input of the gain stage;
- wherein the output of the gain stage generates an analog signal;
- wherein the analog signal is connected to the input of the test logic;
- wherein the output of the test logic is connected to the plurality of circuits;
- wherein the output of the plurality of circuits is connected to the input of the external tester;
- wherein the I/O of the plurality of circuits is connected to the I/O of the CPU;
- wherein at least one characteristic of at least one circuit of the plurality of circuits is sent to the input of the external tester.
14 more elements
A method for characterizing the threshold voltage (VT) of a flash memory cell comprising:
- generating a pulse train signal on a flash memory integrated circuit;
- applying the pulse train signal to an input of an external low-pass filter;
- applying an output of the external low-pass filter to an input of an external gain stage;
- directing an analog signal from the external gain stage to a control gate of the flash memory cell;
- measuring an electrical parameter of the flash memory cell;
- sending the measured electrical parameter of the flash memory cell to an external tester.
3 more elements
A system for testing integrated circuits comprising:
- a means for generating a pulse train signal located on an integrated circuit, the means for generating a pulse train signal having an output;
- a plurality of circuits located on the integrated circuit, each circuit of the plurality of circuits having an input and an output;
- a means for controlling a signal located on the integrated circuit;
- an external means for removing high frequency components from a pulse train signal having an input and an output;
- a means for increasing the voltage of a signal located external to the integrated circuit, the means for increasing the voltage of a signal having an input and an output;
- wherein the means for generating a pulse train signal creates a pulse train signal;
- wherein the pulse train signal is connected to the input of the external means for removing high frequency components;
- wherein the output of the external means for removing high frequency components is connected to an input of the means for increasing the voltage of a signal;
- wherein the output of the means for increasing the voltage of a signal generates an analog signal;
- wherein the analog signal is directed to the input of at least one circuit of the plurality of circuits;
- wherein the output of the at least one circuit of the plurality of circuits is used to characterize the at least one circuit of the plurality of circuits.
8 more elements
Dependencies are inferred from the claim text.