Method for Manufacturing Semiconductor Device
AssigneeKabushiki Kaisha Toshiba
InventorsAtsuko SAKATA, Soichi Yamashita, Yasuyuki Sonoda, Hiroshi Toyoda, Masahiko Hasunuma
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AssigneeKabushiki Kaisha Toshiba
InventorsAtsuko SAKATA, Soichi Yamashita, Yasuyuki Sonoda, Hiroshi Toyoda, Masahiko Hasunuma
Estimating the term…
An embodiment of the present invention provides a method for manufacturing a semiconductor device. This method comprises: forming a seed film at least on an inner face of a recessed portion of a substrate; forming a protection film on the seed film, the protection film being made of a material that is more easily oxidized than a material forming the seed film; heat-treating the protection film; exposing at least part of the seed film by removing at least part of the heat-treated protection film; forming a plating film on the seed film through electrolytic plating to be buried in the recessed portion, by supplying current to the seed film that is at least partially exposed; and removing the plating film except for a portion buried in the recessed portion.
A method for manufacturing a semiconductor device, comprising:
A method for manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.