Apparatus and method for testing a transducer and/or electronic circuitry associated with a transducer
OwnerColin Findlay Steele, John Laurence Pennockinventors
Life of this patent
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Abstract
A method and apparatus for applying a test signal to a node of a signal path of an integrated circuit using a parasitic capacitance of the integrated circuit associated with the node. For example, a parasitic capacitance associated with a bond pad may be used to apply a test signal to a signal path. Alternatively, a parasitic capacitance associated with a shielding element may be used to apply a test signal to the signal path.
Claims29
An integrated circuit having a signal path, the integrated circuit comprising:
- means for coupling a test signal to a node of the signal path via a parasitic capacitance of the integrated circuit associated with the node.
A method of applying a test signal to a node of a signal path of an integrated circuit, the method comprising the steps of:
- coupling a test signal to the node via a parasitic capacitance of the integrated circuit associated with the node.
Dependencies are inferred from the claim text.