Effective dual-energy x-ray attenuation measurement
AssigneeKoninklijke Philips Electronics N. V.
InventorsThomas Koehler, Jens-Peter Schlomka
Life of this patent
Estimating the term…
Loading patent…
AssigneeKoninklijke Philips Electronics N. V.
InventorsThomas Koehler, Jens-Peter Schlomka
Estimating the term…
It is described a method and a CT system for measuring dual-energy X- ray attenuation data of an object. The CT system comprises a rotatable holder, an X-ray source comprising two different X-ray focus points, and an X-ray detection device comprising a plurality of detector elements exhibiting different spectral sensitivities. The method comprises the steps of (a) adjusting the X-ray source such that it emits X-rays originating a first focus point, (b) acquiring first attenuation data separately with first detector elements and with second detector elements, (c) moving the X-ray focus discretely to a second focus point, and (d) acquiring second attenuation data separately with both types of detector elements. Thereby the two focus points are spatially separated from each such that a first beam path originating from the first focus point penetrates a certain voxel within the object and impinges on a first detector element and a second beam path originating from the second X-ray focus point penetrates the same voxel and impinges on a second detector element.
A method for measuring dual-energy X-ray attenuation data of an object under examination by means of a computed tomography system, the tomography system comprising
A computed tomography system for measuring dual-energy X-ray attenuation data of an object under examination, the computed tomography system comprising
(canceled)
A computer-readable medium on which there is stored a computer program
(canceled)
A method of generating a tomographic image comprising
Dependencies are inferred from the claim text.