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US 2010/0165498 A1Published application
Dependent Temperature Control Within Disk Drive Testing Systems
AssigneeTeradyne, Inc.
InventorsBrian S. Merrow, Eric L. Truebenbach, Marc Lesueur Smith
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Abstract
A method of controlling a temperature of a subject test slot in a cluster of test slots includes evaluating a request for a temperature change for the subject test slot to determine if sufficient power is available to achieve the requested temperature change, and inhibiting the requested temperature change unless or until sufficient power is determined to be available to achieve the requested temperature change.
Claims15
A method of controlling a temperature of a test slot in a disk drive testing system, the method comprising:
- regulating temperature changes of a subject test slot based on one or more operating conditions of one or more other test slots neighboring the subject test slot.
A disk drive testing system comprising:
- at least one test rack comprising:
- multiple test slots, each test slot being configured to receive a disk drive for testing;
- and
- test electronics in electrical communication with the test slots and configured to adjust operating temperatures of the test slots,
- wherein the test electronics are configured to regulate changes to the operating temperature of each test slot based, at least in part, on an operating condition of at least one other one of the test slots.
2 more elements
Dependencies are inferred from the claim text.