Apparatus for detecting a sample
AssigneeHermes Microvision, Inc.
InventorsYOU-JIN WANG, JIANXIN WU
Life of this patent
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AssigneeHermes Microvision, Inc.
InventorsYOU-JIN WANG, JIANXIN WU
Estimating the term…
An apparatus for effectively detecting and calibrating a sample of examination system. The apparatus has an optics-electricity assembly for detecting the sample by a light and an elastically supporting assembly for providing motion freedoms to adjust the relative geometric conditions between the optics-electricity assembly and the sample. The elastically supporting assembly has a planer structure and a cubic structure, and provides both motion freedoms on a plane and motion freedoms vertical to the plane. The optics electricity assembly could analyze the received reflected light to get geometric information of the sample, and could adjust the light used to detect the sample.
A system for detecting a sample, comprising:
An apparatus for detecting a sample, comprising:
An apparatus for detecting a sample, comprising:
Dependencies are inferred from the claim text.