Methods and apparatus to test and compensate multi-channel digital-to-analog converters
AssigneeTexas Instruments Incorporated
InventorsRamyanshu Datta, Christopher Michael Barr, Alessandro Paglieri
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AssigneeTexas Instruments Incorporated
InventorsRamyanshu Datta, Christopher Michael Barr, Alessandro Paglieri
Estimating the term…
Methods and apparatus to test and compensate multi-channel digital-to-analog converters (DACs) are described. In some examples, a multi-channel digital-to-analog converter (DAC) and an error detector are implemented in an integrated circuit. The multi-channel DAC includes a first DAC channel configured to generate a first analog representation of a digital input signal, and a second DAC channel configured to generate a second analog representation of the digital input signal. The error detector is configured to compare the first analog representation and the second analog representation to generate a difference signal, and to output a signal indicative of whether the difference signal is greater than a predetermined threshold.
A circuit, comprising:
A method to test a multi-channel digital-to-analog converter (DAC), comprising:
A system to test a multi-channel digital-to-analog converter (DAC), comprising:
Dependencies are inferred from the claim text.